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Large-format Geiger-mode avalanche photodiode arrays and readout circuits

March 1, 2018
  |
Journal Article
Author:
Brian F. Aull
…
Published in:
IEEE J. Sel. Top. Quantum Electron., Vol. 24, No. 2, March/April 2018, 3800510.
Topic:
photonics
R&D area:
R&D group:

Summary

Over the past 20 years, we have developed arrays of custom-fabricated silicon and InP Geiger-mode avalanche photodiode arrays, CMOS readout circuits to digitally count or time stamp single-photon detection events, and techniques to integrate these two components to make back-illuminated solid-state image sensors for lidar, optical communications, and passive imaging. Starting with 4 × 4 arrays, we have recently demonstrated 256 × 256 arrays, and are working to scale to megapixel-class imagers. In this paper, we review this progress and discuss key technical challenges to scaling to large format.
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Summary

Over the past 20 years, we have developed arrays of custom-fabricated silicon and InP Geiger-mode avalanche photodiode arrays, CMOS readout circuits to digitally count or time stamp single-photon detection events, and techniques to integrate these two components to make back-illuminated solid-state image sensors for lidar, optical communications, and passive imaging...

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Large-format Geiger-mode avalanche photodiode arrays and readout circuits

State of the art focal plane arrays of InP/InGaAsP Geiger-mode avalanche photodiodes for active electro-optical applications

October 10, 2016
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Conference Paper
Author:
Jonathan P. Frechette
…
Published in:
2016 MSS Active E-O Systems, 10 October 2016.
Topic:
ladar
R&D area:
R&D group:

Summary

MIT Lincoln Laboratory has developed InP/InGaAsP Geiger-Mode Avalanche Photodiodes and associated readout integrated circuits (ROICs) that have enabled numerous active optical systems over the past decade. Framed and asynchronous photon timing ROIC architectures have been demonstrated. In recent years, efforts at MITLL have focused on technology development to advance the state of the art of framed Gm APD FPAs and a 256x128 pixel FPA with on-chip data thinning has been demonstrated.
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Summary

MIT Lincoln Laboratory has developed InP/InGaAsP Geiger-Mode Avalanche Photodiodes and associated readout integrated circuits (ROICs) that have enabled numerous active optical systems over the past decade. Framed and asynchronous photon timing ROIC architectures have been demonstrated. In recent years, efforts at MITLL have focused on technology development to advance the...

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State of the art focal plane arrays of InP/InGaAsP Geiger-mode avalanche photodiodes for active electro-optical applications

Crosstalk characterization and mitigation in Geiger-mode avalanche photodiode arrays

October 2, 2016
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Conference Paper
Author:
Richard D. Younger
…
Published in:
2016 IEEE Photonics Conf., IPC, 2-6 October 2016.
Topic:
photonics
R&D area:
R&D group:

Summary

Intra focal plane array (FPA) crosstalk is a primary development limiter of large, fine-pixel Geiger-mode avalanche photodiode (Gm-APD) arrays beyond 256×256 pixels. General analysis methods and results from MIT Lincoln Laboratory (MIT/LL) InP-based detector arrays will be presented.
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Summary

Intra focal plane array (FPA) crosstalk is a primary development limiter of large, fine-pixel Geiger-mode avalanche photodiode (Gm-APD) arrays beyond 256×256 pixels. General analysis methods and results from MIT Lincoln Laboratory (MIT/LL) InP-based detector arrays will be presented.

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Crosstalk characterization and mitigation in Geiger-mode avalanche photodiode arrays

Afterpulsing in Geiger-mode avalanche photodiodes for 1.06um wavelength

March 27, 2006
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Journal Article
Author:
Katharine E. Jensen
…
Published in:
Appl. Phys. Lett., Vol. 88, No. 13, 27 March 2006, pp. 133503-1 - 133503-3.
Topic:
photonics
R&D area:
R&D group:

Summary

We consider the phenomenon of afterpulsing in avalanche photodiodes (APDs) operating in gated and free-running Geiger mode. An operational model of afterpulsing and other noise characteristics of APDs predicts the noise behavior observed in the free-running mode. We also use gated-mode data to investigate possible sources of afterpulsing in these devices. For 30-um-diam, 1.06-um-wavelength InGaAsP/InP APDs operated at 290 K and 4 V overbias, we obtained a dominant trap lifetime of td=0.32 us, a trap energy of 0.11 eV, and a baseline dark count rate 245 kHz.
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Summary

We consider the phenomenon of afterpulsing in avalanche photodiodes (APDs) operating in gated and free-running Geiger mode. An operational model of afterpulsing and other noise characteristics of APDs predicts the noise behavior observed in the free-running mode. We also use gated-mode data to investigate possible sources of afterpulsing in these...

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Afterpulsing in Geiger-mode avalanche photodiodes for 1.06um wavelength

Optical down-sampling of wide-band microwave signals

December 1, 2003
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Journal Article
Author:
Paul W. Juodawlkis
…
Published in:
J. Lightwave Technol., Vol. 21, No. 12, December 2003, pp. 3116-3124.
Topic:
signal processing
R&D area:
R&D group:

Summary

Phase-encoded optical sampling allows radio-frequency and microwave signals to be directly down-converted and digitized with high linearity and greater than 60-dB (10-effective-bit) signal-to-noise ratio. Wide-band electrical signals can be processed using relatively low optical sampling rates provided that the instantaneous signal bandwidth is less than the Nyquist sampling bandwidth. We demonstrate the capabilities of this technique by using a 60-MS/s system to down-sample two different FM chirp signals: 1) a baseband (0-250 MHz) linear-chirp waveform and 2) a nonlinear-chirp waveform having a 10-GHz center frequency and a frequency excursion of 1 GHz. We characterize the frequency response of the technique and quantify the analog bandwidth limitation due to the optical pulse width. The 3-dB bandwidth imposed by a 30-ps sampling pulse is shown to be 10.4 GHz. We also investigate the impact of the pulse width on the linearity of the phase-encoded optical sampling technique when it is used to sample high-frequency signals.
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Summary

Phase-encoded optical sampling allows radio-frequency and microwave signals to be directly down-converted and digitized with high linearity and greater than 60-dB (10-effective-bit) signal-to-noise ratio. Wide-band electrical signals can be processed using relatively low optical sampling rates provided that the instantaneous signal bandwidth is less than the Nyquist sampling bandwidth. We...

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Optical down-sampling of wide-band microwave signals

Optically sampled analog-to-digital converters

October 1, 2001
  |
Journal Article
Author:
Paul W. Juodawlkis
…
Published in:
IEEE Trans. Microw. Theory Tech., Vol. 49, No. 10, October 2001, pp. 1840-1853.
Topic:
optics
R&D area:

Summary

Optically sampled analog-to-digital converters (ADCs) combine optical sampling with electronic quantization to enhance the performance of electronic ADCs. In this paper, we review the prior and current work in this field, and then describe our efforts to develop and extend the bandwidth of a linearized sampling technique referred to as phase-encoded optical sampling. The technique uses a dual-output electrooptic sampling transducer to achieve both high linearity and 60-dB suppression of laser amplitude noise. The bandwidth of the technique is extended by optically distributing the post-sampling pulses to an array of time-interleaved electronic quantizers. We report on the performance of a 505-MS/s (megasample per second) optically sampled ADC that includes high-extinction LiNbO(3) 1-to-8 optical time-division demultiplexers. Initial characterization of the 505-MS/s system reveals a maximum signal-to-noise ratio of 51 dB (8.2 bits) and a spur-free dynamic range of 61 dB. The performance of the present system is limited by electronic quantizer noise, photodiode saturation, and preliminary calibration procedures. None of these fundamentally limit this sampling approach, which should enable multigigahertz converters with 12-b resolution. A signal-to-noise analysis of the phase-encoded sampling technique shows good agreement with measured data from the 505-MS/s system.
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Summary

Optically sampled analog-to-digital converters (ADCs) combine optical sampling with electronic quantization to enhance the performance of electronic ADCs. In this paper, we review the prior and current work in this field, and then describe our efforts to develop and extend the bandwidth of a linearized sampling technique referred to as...

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Optically sampled analog-to-digital converters
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