Keith Doyle elected a 2014 SPIE Fellow

Photo of Keith DoyleDr. Keith B. Doyle, associate leader of the Engineering Analysis and Testing Group at MIT Lincoln Laboratory, was elected a 2014 Fellow of SPIE, an international society dedicated to advancing light-based technologies. Dr. Doyle's elevation to this rank recognizes his "achievements in advances in optomechanical engineering and integrated modeling."

During his more than 25 years' involvement in optomechanical engineering, Dr. Doyle has worked on a diverse range of optical and communication sensors, including ground, aerial, and space-borne systems for astronomical, remote sensing, laser communication, and imaging applications, as well as optical systems for the microlithography, telecommunications, and consumer optics industries. Considered an expert in the field of integrated modeling, he has developed novel optomechanical analysis techniques used to optimize system architectures and enable the development of cutting-edge optical system technology. 

At Lincoln Laboratory, Dr. Doyle leads the multidisciplinary modeling and integrated analysis and testing efforts for the Engineering Division. His group is advancing the design of prototype hardware through structurally novel designs, high efficiency thermal-fluid heat exchangers, advanced environmental testing techniques, and innovative modeling tools. He is currently the associate manager of an airborne laser communications program.

Dr. Doyle is the lead author of two editions of the SPIE monograph Integrated Optomechanical Analysis and has authored or co-authored 38 technical articles. He is an instructor of SPIE short courses, including Finite Element Analysis of Optics and Integrated Optomechanical Analysis, and has taught Optomechanical Analysis at the Institute of Optics at the University of Rochester, Rochester, New York, as part of the institute’s summer course series. He holds a BS degree in engineering from Swarthmore College, an MS degree in mechanical engineering from Northeastern University, and a PhD degree in engineering mechanics with a minor in optical sciences from the University of Arizona.

SPIE was founded in 1955 as the Society of Photographic Instrumentation Engineers and has evolved to reflect the expanding field of optics and photonics. Promotion to Fellow is based upon the member’s scientific and technical contributions to optics, photonics, and imaging and the member’s support to the optics community and SPIE. Today, approximately 235,000 members from approximately 155 countries contribute to SPIE's scientific mission. The society annually sponsors about 25 technical forums and programs, maintains the SPIE Digital Library of more than 375,000 research papers drawn from SPIE's conference proceedings and its nine peer-reviewed journals, and has published 165 ebooks.

Posted January 2014

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