Publications
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High-quality 150 nm InP-to-silicon epitaxial transfer for silicon photonic integrated circuits
Summary
Summary
We demonstrate the transfer of the largest (150 mm in diameter) available InP-based epitaxial structure to the silicon-on-insulator substrate through a direct wafer-bonding process. Over 95% bonding yield and a void-free bonding interface was obtained. A multiple quantum-well diode laser structure is well-preserved after bonding, as indicated by the high-resolution...
A 64 x 64-pixel CMOS test chip for the development of large-format ultra-high-speed snapshot imagers
Summary
Summary
A 64 x 64-pixel test circuit was designed and fabricated in 0.18- m CMOS technology for investigating high-speed imaging with large-format imagers. Several features are integrated into the circuit architecture to achieve fast exposure times with low-skew and jitter for simultaneous pixel snapshots. These features include an H-tree clock distribution...
Integration of high-speed surface-channel charge coupled devices into an SOI CMOS process using strong phase shift lithography
Summary
Summary
To enable development of novel signal processing circuits, a high-speed surface-channel charge coupled device (CCD) process has been co-integrated with the Lincoln Laboratory 180-nm RF fully depleted silicon-on-insulator (FDSOI) CMOS technology. The CCDs support charge transfer clock speeds in excess of 1 GHz while maintaining high charge transfer efficiency (CTE)...
Design approaches for digitally dominated active pixel sensors: leveraging Moore's law scaling in focal plane readout design
Summary
Summary
Although CMOS technology scaling has provided tremendous power and circuit density benefits for innumerable applications, focal plane array (FPA) readouts have largely been left behind due to dynamic range and signal-to-noise considerations. However, if an appropriate pixel front end can be constructed to interface with a mostly digital pixel, it...
Back-illuminated three-dimensionally integrated CMOS image sensors for scientific applications
Summary
Summary
SOI-based active pixel image sensors have been built in both monolithic and vertically interconnected pixel technologies. The latter easily supports the inclusion of more complex pixel circuitry without compromising pixel fill factor. A wafer-scale back-illumination process is used to achieve 100% fill factor photodiodes. Results from 256 x 256 and...
The digital focal plane array (DFPA) architecture for data processing "on-chip"
Summary
Summary
The digital focal plane array (DFPA) project seeks to develop readout integrated circuits (ROICs) utilizing aggressively scaled and commercially available CMOS. Along with focal plane scaling and readout robustness benefits, the DFPA architecture provides a very simple way to implement processing algorithms directly on image data, in real-time, and prior...
Optimized growth of lattice-matched In(x)Al(1-x)N/GaN heterostructures by molecular beam epitaxy
Summary
Summary
The authors present a systematic study on the growth of the ternary compound In(x)Al(1-x)N by molecular beam epitaxy. This work concentrates on In mole fractions x around 0.17, as this composition is in-plane lattice matched to GaN. At a growth temperature of 540 degrees C, high quality material was obtained...
Laser radar imager based on 3D integration of Geiger-mode avalanche photodiodes with two SOI timing circuit layers
Summary
Summary
We have developed focal-plane arrays and laser-radar (ladar) imaging systems based on Geiger-mode avalanche photodiodes (APDs) integrated with high-speed all-digital CMOS timing circuits. A Geiger-mode APD produces a digital pulse upon detection of a single photon. This pulse is used to stop a fast digital counter in the pixel circuit...
Nitride-based UV Geiger-Mode avalanche photodiodes
Summary
Summary
III-N materials currently enjoy a predominant role in the formation of solid-state light emitters for [lamda]
CMOS detector technology
Summary
Summary
An entry level overview of state-of-the-art CMOS detector technology is presented. Operating principles and system architecture are explained in comparison to the well-established CCD technology, followed by a discussion of important benefits of modern CMOS-based detector arrays. A number of unique CMOS features including different shutter modes and scanning concepts...