Single-Electron Detection Method and Apparatus for Solid-State Intensity Image Sensors with a Charge-Splitting Device

Electron counters are instrumental to numerous scientific disciplines, including astrophysics and medical imaging technologies. They are key to the processing and analysis of images, particularly when precise measurements and high sensitivity are needed. The need for devices that can provide accurate electron counts in high-speed imaging arrays over various light levels is therefore crucial. Current electron counters, particularly those used with large-format, high-speed imaging arrays, often struggle to maintain high dynamic range and sensitivity. Complications like noise interference can often obscure or distort the signals, resulting in less accurate readings. In addition, conventional methods struggle with effectively handling both high and low charge levels, making it challenging to image scenes across varied light levels. These limitations present significant constraints on the range and detail of images that can be captured.

Technology Description

The invention relates to an electron counter employing a charge-coupled-device (CCD) register that is designed to transfer electrons to a Geiger-mode avalanche diode (GM-AD) array, which is operatively linked to the output of the CCD register. Its unique architecture allows it to deal with both high and low charge levels. In high charge levels, a nondestructive amplifier senses the charge at the CCD output and delivers an analog indication of the charge. Noiseless charge splitters/meters handle low charge levels by dividing the charge into single-electron packets. Each packet is detected by a GM-AD, which provides a digital readout if an electron is present. What sets this technology apart is its remarkable suitability for counting photoelectrons produced by large-format, high-speed imaging arrays. It offers both a high dynamic range and high sensitivity, enabling it to effectively capture images across a broad spectrum of light levels. As a result, it promises enhanced detail and performance in imaging applications that demand precise electron counting.