- 1 GHz
- 320 I/O pins
- 4 power supplies
- Tester-per-pin architecture
- A digital test comprises pin, level, timing, and vector configurations; continuity, functional, shmoo, memory, and static/dynamic current tests; and external interface tests including prober/handler control and data logging
Test
The Microsystems Prototyping Foundry has in-house testing to validate new devices, designs, and prototypes. These testing capabilities include high-speed digital and analog wafer probe as well as wafer and chip-level 4K probing capabilities.
We are equipped to perform both parametric testing (right) and digital testing (left) at the wafer level with UF200 8-inch probers
High-Speed Digital and Parametric Testing
Advantest SOC 93000 Digital Tester
Keithley 630 Parametric Test System
- 24 pins (option to go to 64)
- 5 source measure units (option to go to 8)
- Sun Blade system control
- KTE test programs featuring C language, extensive libraries of parametric subroutines, capability to build custom libraries, and seamless interface with prober
- High-frequency matrix
UF3000A 12-Inch Automatic Prober
- Automatic probe and digital circuit testing for both 200 mm and 300 mm wafers
- Probe card needles touch down on circuit pads for electrical testing
- Electrical stimulus for these tests comes from our high-speed digital tester
Aracor Semiconductor Irradiation System
- Uses an X-ray tube to irradiate a device under test
- Enables examination and characterization of total ionizing dose effects on devices fabricated by using either a standard or radiation-hardened process
- Tests can be performed at both the wafer- and packaged level
Radio Frequency (RF) Test
Focus Microwaves Load Pull
- Provides key characterization capabilities needed to understand RF devices
- Fundamental and harmonic tuning from 2–36 GHz
- High-voltage pulsed I-V measurement and noise characterization
Contact us
Learn more about the capabilities and opportunities in the Microsystems Prototyping Foundry.