Directly deposited optical-blocking filters (DD OBFs) have the potential to improve filter performance and lower risk and cost for future x-ray imaging spectroscopy missions. However, they have not been fully characterized on high-performance charge coupled devices (CCDs). This paper reports the results of DD OBFs processed on high-performance photon-counting CCDs. It is found that CCD performance is not degraded by deposition of such filters. X-ray and optical transmission through the OBF is characterized and found to match theoretical expectation. Light-leaks through pinholes and the side and back surfaces are found to lower the optical extinction ratio; various coating processes are developed to resolve these issues.