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Impact ionization in AlxGa1-xASySb1-y avalanche photodiodes
April 21, 2014
      
  
    Journal Article
      
  
    Published in:
  
      App. Phys. Lett., Vol. 104, No. 16, 21 April 2014, 162103.
      
  
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    Summary
Avalanche photodiodes (APDs) have been fabricated in order to determine the impact ionization coefficients of electrons (alpha) and holes (beta) in AlxGa1-xAsySb1-y lattice matched to GaSb for three alloy compositions: (x=0.40, y=0.035), (x=0.55, y=0.045), and (x=0.65, y=0.054).  The impact ionization coefficients were calculated from photomultiplication measurements made on specially designed APDs, which allowed for both pure electron and pure hole injection in the same device.  Photo-multiplication measurements were made at temperatures ranging from 77K to 300K for all three alloys.  A quasi-physical model with an explicit temperature dependence was used to express the impact ionization coefficients as a function of electric-field strength and temperature.  For all three alloys, it was found that alpha < beta at any given temperature.  In addition, the values of the impact ionization coefficients were found to decrease as the aluminum concentration of the AlGaAsSb alloy was increased.  A value between 1.2 and 4.0 was found for beta/x, which is dependent on temperature, alloy composition, and electric-field strength.
      
  
    Summary
Avalanche photodiodes (APDs) have been fabricated in order to determine the impact ionization coefficients of electrons (alpha) and holes (beta) in AlxGa1-xAsySb1-y lattice matched to GaSb for three alloy compositions: (x=0.40, y=0.035), (x=0.55, y=0.045), and (x=0.65, y=0.054). The impact ionization coefficients were calculated from photomultiplication measurements made on specially designed...
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